Chapter 2 . Synchrotron X - ray Studies of Surface Disordering
نویسنده
چکیده
In this research program, we use modern x-ray scattering techniques to study structures and phase transitions in thin films and on surfaces. We have two principal experimental facilities, one at MIT and the other at the National Synchrotron Light Source at Brookhaven National Laboratory. At MIT, we have four high-resolution computer-controlled x-ray spectrometers. The angular resolution can be made as fine as 1.8 seconds of arc, which enables us to probe the development of order from distances of the order of the x-ray wavelength 1 A, up to 30,000 A. The sample temperature can be varied between 2K and 500K with a relative accuracy of 2 x 103 K. At the National Synchrotron Light Source, in collaboration with IBM, we have three fully instrumented beam lines. Two of these beam lines allow us to make studies with photons varying in energy between 3 and 12 keV; the third has a fixed energy of 17 keV. These facilities make possible high-resolution scattering experiments with a flux more than three orders of magnitude larger than that of a rotating anode x-ray generator. In collaboration with Professor Simon G.J. Mochrie, we have now designed, built, and commissioned a second-generation extremely versatile x-ray surface facility which allows a wide range of surface scattering experiments.
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................................................................................................................................................... iii ACKNOWLEDGMENTS ............................................................................................................................. v LIST OF TABLES .........................................................................................
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تاریخ انتشار 2009